Zastosowania
Wafer Inspection Helps Reduce Costs and Increase Returns.
VITRONIC machine vision solutions can help you reduce the costs of wafer inspection, which means higher returns. They ensure that only good wafers exit production or undergo further processing.
VITRONIC machine vision solutions make sure that faulty wafers are separated and rejected. As a result, the finishing of defective parts is a thing of the past.
VINSPEC SOLAR Inspects Wafers for
- micro-cracks
- crystalline structure
- geometrical properties
- surface properties
- edge defects
… and classifies them accordingly.
VITRONIC's rugged and reliable VINSPEC SOLAR WIS inspection solution can inspect all formats and crystalline structures (mono, quasi-mono, multicrystalline) – regardless of whether this occurs at the end or as the first step during cell production.
Osoba do kontaktu
Michał Żuchora
Prezes Zarządu/ President of the Board
Chcesz dowiedzieć się więcej o naszych rozwiązaniach i usługach?
lub skontaktuj się z nami telefonicznie pod numerem:
+48 77 481 00 03
Odwiedź nas na targach:
- VINSPEC SOLAR systems have a proven track record of being extremely accurate, sturdy, and reliable
- Very high customer benefit
- Very good price/performance ratio
- Global network and service offering
- More than 30 years of experience in industrial machine vision systems
- Standard systems, customizable to specific processes and customer needs
- If your demands grow, the modular design of VITRONIC solutions makes system expansion quick and easy
- Hardware and software package from a single source
- 1000+ camera systems installed in cell and module plants all over the world
- Customers include Hanwha/Q Cells, Solarworld, Motech, Yingli, JA-Solar, Trina, Jinko, TSEC, Canadian Solar etc.
With the VITRONIC newsletter we keep you informed about company news and new products as well as the latest trade show and event reports.
Your advantage as a newsletter subscriber
If you are logged in as a registered user, you also have unlimited access to all protected documents.
en
de
es
fr
pl
ru
ar
zh
jp
ko
